High-speed Automatic Testing for Advanced Components

Pin Drivers, Comparators, DACs, and Active Loads Have Key Roles; Size, Speed, Accuracy, and Repeatability are Constraints

Designers of automatic test equipment (ATE) systems for advanced components have always had a dilemma: in order to test the newest, fastest, most precise products, they themselves need components that are even better than they are testing. The unique design constraints of ATE add to the difficulties of assembling a system for testing high-speed, high-pin-count devices. Read full article



Bill Gotschewski


Bill Schweber